Testing Win X-ray, a Monte Carlo Program for X-ray Microanalysis in the Scanning Electron Microscope

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Win X-ray: a new Monte Carlo program that computes X-ray spectra obtained with a scanning electron microscope.

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ژورنال

عنوان ژورنال: Microscopy and Microanalysis

سال: 2005

ISSN: 1431-9276,1435-8115

DOI: 10.1017/s1431927605510729